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Simultaneous Noise and Impedance Fitting to Transition-Edge Sensor Data Using Differential Evolution

Year of publication

2020

Authors

Helenius, A. P.; Puurtinen, T. A.; Kinnunen, K. M.; Maasilta, I. J.

Abstract

We discuss a robust method to simultaneously fit a complex multi-body model both to the complex impedance and the noise data for transition-edge sensors. It is based on a differential evolution (DE) algorithm, providing accurate and repeatable results with only a small increase in computational cost compared to the Levenberg–Marquardt (LM) algorithm. Test fits are made using both DE and LM methods, and the results compared with previously determined best fits, with varying initial value deviations and limit ranges for the parameters. The robustness of DE is demonstrated with successful fits even when parameter limits up to a factor of 10 from the known values were used. It is shown that the least squares fitting becomes unreliable beyond a 10% deviation from the known values.
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Organizations and authors

University of Jyväskylä

Helenius Ari

Maasilta Ilari Orcid -palvelun logo

Kinnunen Kimmo Orcid -palvelun logo

Puurtinen Tuomas

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Volume

200

Issue

5-6

Pages

213-219

​Publication forum

60885

​Publication forum level

1

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Partially open publication channel

Self-archived

Yes

Other information

Fields of science

Physical sciences; Electronic, automation and communications engineering, electronics

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

No

Co-publication with a company

No

DOI

10.1007/s10909-020-02489-0

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes