Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation
Year of publication
2021
Authors
Coronetti, Andrea; Garcìa Alìa, Rubén; Budroweit, Jan; Rajkowski, Tomasz; Da Costa Lopes, Israel; Niskanen, Kimmo; Söderström, Daniel; Cazzaniga, Carlo; Ferraro, Rudy; Danzeca, Salvatore; Mekki, Julien; Manni, Florent; Dangla, David; Virmontois, Cedric; Kerboub, Nourdine; Koelpin, Alexander; Saigné, Frederic; Wang, Pierre; Pouget, Vincent; Touboul, Antoine; Javanainen, Arto; Kettunen, Heikki; Coq Germanicus, Rosine
Show moreAbstract
Functional verification schemes at a level different than component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricting intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system in general because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test are provided to allow understanding which information can be extracted from these kinds of functional verification schemes in order to compare them with the reliability and availability requirements. The use of a general scaling factor for the observed high-level cross-sections allows converting test cross-sections into orbit rates.
Show moreOrganizations and authors
Publication type
Publication format
Article
Parent publication type
Journal
Article type
Original article
Audience
ScientificPeer-reviewed
Peer-ReviewedMINEDU's publication type classification code
A1 Journal article (refereed), original researchPublication channel information
Journal/Series
Publisher
Volume
68
Issue
5
Pages
958-969
ISSN
Publication forum
Publication forum level
1
Open access
Open access in the publisher’s service
Yes
Open access of publication channel
Partially open publication channel
Self-archived
Yes
Other information
Fields of science
Physical sciences; Electronic, automation and communications engineering, electronics
Keywords
[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Publication country
United States
Internationality of the publisher
International
Language
English
International co-publication
Yes
Co-publication with a company
Yes
DOI
10.1109/TNS.2021.3061197
The publication is included in the Ministry of Education and Culture’s Publication data collection
Yes