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Radiation hardness assurance through system-level testing : risk acceptance, facility requirements, test methodology and data exploitation

Year of publication

2021

Authors

Coronetti, Andrea; Garcìa Alìa, Rubén; Budroweit, Jan; Rajkowski, Tomasz; Da Costa Lopes, Israel; Niskanen, Kimmo; Söderström, Daniel; Cazzaniga, Carlo; Ferraro, Rudy; Danzeca, Salvatore; Mekki, Julien; Manni, Florent; Dangla, David; Virmontois, Cedric; Kerboub, Nourdine; Koelpin, Alexander; Saigné, Frederic; Wang, Pierre; Pouget, Vincent; Touboul, Antoine; Javanainen, Arto; Kettunen, Heikki; Coq Germanicus, Rosine
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Abstract

Functional verification schemes at a level different than component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower level of assurance can be accepted. Despite the promising potential, system-level radiation testing can be applied to the functional verification of systems under restricting intrinsic boundaries. Most of them are related to the use of hadrons as opposed to heavy ions. Hadrons are preferred for the irradiation of any bulky system in general because of their deeper penetration capabilities. General guidelines about the test preparation and procedure for a high-level radiation test are provided to allow understanding which information can be extracted from these kinds of functional verification schemes in order to compare them with the reliability and availability requirements. The use of a general scaling factor for the observed high-level cross-sections allows converting test cross-sections into orbit rates.
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Organizations and authors

University of Jyväskylä

Coronetti Andrea

Javanainen Arto Orcid -palvelun logo

Söderström Daniel Orcid -palvelun logo

Kettunen Heikki

Publication type

Publication format

Article

Parent publication type

Journal

Article type

Original article

Audience

Scientific

Peer-reviewed

Peer-Reviewed

MINEDU's publication type classification code

A1 Journal article (refereed), original research

Publication channel information

Publisher

IEEE

Volume

68

Issue

5

Pages

958-969

​Publication forum

57566

​Publication forum level

1

Open access

Open access in the publisher’s service

Yes

Open access of publication channel

Partially open publication channel

Self-archived

Yes

Other information

Fields of science

Physical sciences; Electronic, automation and communications engineering, electronics

Keywords

[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

Publication country

United States

Internationality of the publisher

International

Language

English

International co-publication

Yes

Co-publication with a company

Yes

DOI

10.1109/TNS.2021.3061197

The publication is included in the Ministry of Education and Culture’s Publication data collection

Yes