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Diffusion of silicon in ion implanted GaAs

Likonen, Jari; Ahlgren, T.; Slotte, J.; Räisänen, Jyrki; Keinonen, J.
11th International Conference on Secondary Ion Mass Spectrometry, SIMS XI1998

Investigation of annealing behaviour of implanted nitrogen in InP by SIMS, NRB and RBS

Peer-reviewed
Likonen, Jari; Väkeväinen, K.; Ahlgren, T.; Räisänen, Jyrki; Rauhala, Esko; Keinonen, J.
10th International Conference on Secondary Ion Mass Spectrometry (SIMS X)1997

Time-of-flight secondary ion mass spectrometry analysis of chitosan-treated viscose fibres

Peer-reviewed
DOI
10.1016/j.ab.2018.07.021
Matjaž Finšgar; Tijana Ristić; Pedro Fardim; Lidija Fras Zemljič
Analytical Biochemistry2018

Diffusion of arsenic in Germanium

Peer-reviewed
Likonen, Jari; Vainonen-Ahlgren, E.; Ahlgren, T.; Lehto, Sari
12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII2000

Optimising primer residue removal with the aid of SIMS, purge and trap gas chromatography mass spectrometry and contact angle measurements

Peer-reviewed
Lehto, Sari; Likonen, Jari; Riihisaari, Tarja; Eränen, A.; Kiviranta, Arto; Virtanen, J.; Sandell, E...
12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII2000

Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

Peer-reviewed
Likonen, Jari; Saarilahti, J.; Grönberg, Leif; Kiviranta, Mikko
Ninth International Conference on Secondary Ion Mass Spectrometry, SIMS IX1994

SIMS- and NRA-measurements of depth profiles of implanted ions

Peer-reviewed
Likonen, Jari; Hautala, Mikko
8th International Conference on Secondary Ion Mass Spectrometry (SIMS VIII)1992

Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry

Peer-reviewed
DOI
10.1016/j.apsusc.2014.06.091
Ghezzi, F.; Caniello, R.; Giubertoni, D.; Bersani, M.; Hakola, Antti; Mayer, M.; Rohde, V.; Anderle,...
Applied Surface Science2014

Secondary clarifier conditionsconducting to secondary phosphorus release in a BNR plant

Peer-reviewed
Mikola, Anna; Rautiainen, Jyri; Vahala, Riku
Water Science and Technology2009

Secondary clarifier conditions conducting to secondary phosphorus release in a BNR plant

Peer-reviewed
Mikola, Anna; Rautiainen, Jyri; Vahala, Riku
International Water Association (IWA)2009

Diffusion of silicon in ion implanted GaAs

1998

Investigation of annealing behaviour of implanted nitrogen in InP by SIMS, NRB and RBS

Peer-reviewed
1997

Time-of-flight secondary ion mass spectrometry analysis of chitosan-treated viscose fibres

Peer-reviewed
DOI
10.1016/j.ab.2018.07.021
2018

Diffusion of arsenic in Germanium

Peer-reviewed
2000

Optimising primer residue removal with the aid of SIMS, purge and trap gas chromatography mass spectrometry and contact angle measurements

Peer-reviewed
2000

Characterization of Nb/Al-AlOx/Nb Josephson junction structures by SIMS, RS and anodization spectroscopy

Peer-reviewed
1994

SIMS- and NRA-measurements of depth profiles of implanted ions

Peer-reviewed
1992

Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometry

Peer-reviewed
DOI
10.1016/j.apsusc.2014.06.091
2014

Secondary clarifier conditionsconducting to secondary phosphorus release in a BNR plant

Peer-reviewed
2009

Secondary clarifier conditions conducting to secondary phosphorus release in a BNR plant

Peer-reviewed
2009