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Year

ToF-SIMS characterization of modified starch on fine and LWC base papers

Peer-reviewed
DOI
10.3183/NPPRJ-2007-22-01-p131-135
Juhanoja, Jyrki; Fagerholm, Heidi; Hyvärinen, Sari; Peltonen, Soili; Kataja, Kirsi; Lampinen, Henna;...
Nordic Pulp and Paper Research Journal2007

Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Peer-reviewed
Open access
DOI
10.1016/j.corsci.2022.110833
Yue, Xiaoqi; Malmberg, Per; Isotahdon, Elisa; Ratia-Hanby, Vilma; Huttunen-Saarivirta, Elina; Leygra...
Corrosion Science2023

Multi-technique surface characterization of bio-based films from sisal cellulose and its esters: a FE-SEM, μ-XPS and ToF-SIMS approach

Peer-reviewed
DOI
10.1007/s10570-014-0216-4
Bruno Rodrigues; Elina Heikkilä; Elisabete Frollini; Pedro Fardim
Cellulose2014

Occurrence of GGM in Paper by ToF-SIMS

Lindqvist, Hanna; Bialczak, Sylwia; Sundberg Anna
-2013

ToF-SIMS 3d analysis of thin films deposited in high aspect ratio structures via atomic layer deposition and chemical vapor deposition

Peer-reviewed
Open access
DOI
10.3390/nano9071035
Kia, Alireza M.; Haufe, Nora; Esmaeili, Sajjad; Mart, Clemens; Utriainen, Mikko; Puurunen, Riikka L....
Nanomaterials2019

Characteristic fragment ions from lignin and polysaccharides in ToF-SIMS

Peer-reviewed
Tokareva, Elena N.;. Pranovich, Andrey V.; Holmbom, Bjarne R.
Wood Science and Technology2011

Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

DOI
10.1016/j.corsci.2023.111137
Pan, Jinshan; Yue, Xiaoqi; Malmberg, Per; Isotahdon, Elisa; Ratia-Hanby, Vilma; Huttunen-Saarivirta,...
Corrosion Science2023

ToF-SIMS Analysis of UV-Switchable TiO2-Nanoparticle-Coated Paper Surface

Peer-reviewed
DOI
10.1021/la304731m
Stepien, Milena; Saarinen, Jarkko J.; Teisala, Hannu; Tuominen, Mikko; Aromaa, Mikko; Haapanen, Jann...
Langmuir2013

Surface chemistry of vessel elements by FE-SEM, ?-XPS and ToF-SIMS

Peer-reviewed
DOI
10.1515/HF.2011.064
Orblin, Elina; Eta, Valerie; Fardim, Pedro
Holzforschung 2011

Dopant Concentration Analysis of ALD Thin Films in 3D Structures by ToF-SIMS

Open access
Kia, Alireza M.; Weinreich, Wenke; Utriainen, Mikko; Puurunen, Riikka L.; Haufe, Nora
19th International Conference on Atomic Layer Deposition, ALD 20192019

ToF-SIMS characterization of modified starch on fine and LWC base papers

Peer-reviewed
DOI
10.3183/NPPRJ-2007-22-01-p131-135
2007

Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Peer-reviewed
Open access
DOI
10.1016/j.corsci.2022.110833
2023

Multi-technique surface characterization of bio-based films from sisal cellulose and its esters: a FE-SEM, μ-XPS and ToF-SIMS approach

Peer-reviewed
DOI
10.1007/s10570-014-0216-4
2014

Occurrence of GGM in Paper by ToF-SIMS

2013

ToF-SIMS 3d analysis of thin films deposited in high aspect ratio structures via atomic layer deposition and chemical vapor deposition

Peer-reviewed
Open access
DOI
10.3390/nano9071035
2019

Characteristic fragment ions from lignin and polysaccharides in ToF-SIMS

Peer-reviewed
2011

Reply to comment on “Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)”

DOI
10.1016/j.corsci.2023.111137
2023

ToF-SIMS Analysis of UV-Switchable TiO2-Nanoparticle-Coated Paper Surface

Peer-reviewed
DOI
10.1021/la304731m
2013

Surface chemistry of vessel elements by FE-SEM, ?-XPS and ToF-SIMS

Peer-reviewed
DOI
10.1515/HF.2011.064
2011

Dopant Concentration Analysis of ALD Thin Films in 3D Structures by ToF-SIMS

Open access
2019